Jae-Young Sung

According to our database, Jae-Young Sung authored at least 1 paper in 2020.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2020

Reliability Analysis by Charge Migration of 3D SONOS Flash Memory.

Jun-Kyo Jeong, Jae-Young Sung, Hee-Hun Yang, Hi-Deok Lee, Ga-Won Lee

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020