Jay Nandy

Aravindan Raghuveer

Proceedings of the Thirty-Eighth AAAI Conference on Artificial Intelligence, 2024

2023

Improving Fairness-Accuracy tradeoff with few Test Samples under Covariate Shift.

[BibT_eX]

[DOI]

Shreyas Havaldar

Jatin Chauhan

Karthikeyan Shanmugam

Aravindan Raghuveer

CoRR, 2023

Non-Uniform Adversarial Perturbations for Discrete Tabular Datasets.

[BibT_eX]

[DOI]

Proceedings of the 32nd ACM International Conference on Information and Knowledge Management, 2023

2022

Multi-Variate Time Series Forecasting on Variable Subsets.

[BibT_eX]

[DOI]

Proceedings of the KDD '22: The 28th ACM SIGKDD Conference on Knowledge Discovery and Data Mining, Washington, DC, USA, August 14, 2022

Compact Feature Representation for Unsupervised Ood Detection.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Geoscience and Remote Sensing Symposium, 2022

Domain-Agnostic Contrastive Representations for Learning from Label Proportions.

[BibT_eX]

[DOI]

Proceedings of the 31st ACM International Conference on Information & Knowledge Management, 2022

2021

Adversarially Robust Classifier with Covariate Shift Adaptation.

[BibT_eX]

[DOI]

CoRR, 2021

Distributional Shifts In Automated Diabetic Retinopathy Screening.

[BibT_eX]

[DOI]

Proceedings of the 2021 IEEE International Conference on Image Processing, 2021

2020

Towards Maximizing the Representation Gap between In-Domain & Out-of-Distribution Examples.

[BibT_eX]

[DOI]

Proceedings of the Advances in Neural Information Processing Systems 33: Annual Conference on Neural Information Processing Systems 2020, 2020

Approximate Manifold Defense Against Multiple Adversarial Perturbations.

[BibT_eX]

[DOI]

Proceedings of the 2020 International Joint Conference on Neural Networks, 2020

2018

Normal Similarity Network for Generative Modelling.

[BibT_eX]

[DOI]

Proceedings of the 2018 IEEE International Conference on Image Processing, 2018

2016

An Incremental Feature Extraction Framework for Referable Diabetic Retinopathy Detection.

[BibT_eX]

[DOI]