Jean-Claude Lecomte

According to our database, Jean-Claude Lecomte authored at least 2 papers between 2005 and 2009.

Collaborative distances:

• Dijkstra number of seven.
• Erdős number of seven.

2009

An advanced quality and reliability assessment approach applied to thermal stress issues in electronic components and assemblies.

Michael Hertl, Diane Weidmann, Jean-Claude Lecomte

Microelectron. Reliab., 2009

2005

New experimental approach for failure prediction in electronics: Topography and deformation measurement complemented with acoustic microscopy.

Isaline Richard, Romain Fayolle, Jean-Claude Lecomte

Microelectron. Reliab., 2005