Jia-Wei Chang

According to our database1, Jia-Wei Chang
  • authored at least 12 papers between 2004 and 2017.
  • has a "Dijkstra number"2 of five.

Timeline

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Bibliography

2017
A Deep Convolutional Neural Network Based Virtual Elderly Companion Agent.
Proceedings of the 8th ACM on Multimedia Systems Conference, 2017

The Effects of Fusing 635 Brainstorming and C-Sketch Methods on the Creativity of Industrial Design.
Proceedings of the 17th IEEE International Conference on Advanced Learning Technologies, 2017

2016
Integrating a semantic-based retrieval agent into case-based reasoning systems: A case study of an online bookstore.
Computers in Industry, 2016

Impact of Using Creative Thinking Skills and Open Data on Programming Design in a Computer-Supported Collaborative Learning Environment.
Proceedings of the 16th IEEE International Conference on Advanced Learning Technologies, 2016

2015
A Cluster-based Personalized Item Recommended Approach on the Educational Assessment System.
iJET, 2015

2013
Improving of Segmental LMR-Mapping Based Voice Conversion Method.
IJCLCLP, 2013

基於音段式LMR 對映之語音轉換方法的改進 (Improving of Segmental LMR-Mapping Based Voice Conversion Methods) [In Chinese].
Proceedings of the 25th Conference on Computational Linguistics and Speech Processing, 2013

A voice conversion method mapping segmented frames with linear multivariate regression.
Proceedings of the International Conference on Machine Learning and Cybernetics, 2013

2012
以線性多變量迴歸來對映分段後音框之語音轉換方法 (A Voice Conversion Method Mapping Segmented Frames with Linear Multivariate Regression) [In Chinese].
Proceedings of the 24th Conference on Computational Linguistics and Speech Processing, 2012

2009
An unsupervised neural network approach for automatic semiconductor wafer defect inspection.
Expert Syst. Appl., 2009

2005
An Unsupervised Self-Organizing Neural Network for Automatic Semiconductor Wafer Defect Inspection.
Proceedings of the 2005 IEEE International Conference on Robotics and Automation, 2005

2004
Using a self-organizing neural network for wafer defect inspection.
Proceedings of the IEEE International Conference on Systems, 2004


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