Jingcun Liu

Orcid: 0000-0002-6155-1450

According to our database1, Jingcun Liu authored at least 8 papers between 2015 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2022
GaN MIS-HEMTs in Repetitive Overvoltage Switching: Parametric Shift and Recovery.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

Accelerating the Recovery of p-Gate GaN HEMTs after Overvoltage Stresses.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021
Failure Mechanisms of Cascode GaN HEMTs Under Overvoltage and Surge Energy Events.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

Robustness of GaN Gate Injection Transistors under Repetitive Surge Energy and Overvoltage.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020
Surge Energy Robustness of GaN Gate Injection Transistors.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Physics of Degradation in SiC MOSFETs Stressed by Overvoltage and Overcurrent Switching.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2018
Design of Wideband GHz Electric Field Sensor Integrated with Optical Fiber Transmission Link for Electromagnetic Pulse Signal Measurement.
Sensors, 2018

2015
Study on Miniaturized UHF Antennas for Partial Discharge Detection in High-Voltage Electrical Equipment.
Sensors, 2015


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