Jinshun Liu

According to our database, Jinshun Liu authored at least 10 papers between 2020 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2025

Super Resolution Reconstruction of Temperature Field of Falling Film Based on PLIF40.

Ting Xue, Haopeng Wu, Jinshun Liu, Yan Wu

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2025

2024

Measurement of 3-D Characteristics of Falling Liquid Film Based on SLIF.

Jinshun Liu, Ting Xue

IEEE Trans. Instrum. Meas., 2024

An Interface Velocity Measurement Method of Liquid Film Based on SLIF.

Jinshun Liu, Ting Xue

IEEE Trans. Instrum. Meas., 2024

A Dual-sided PLIF40 Method to Mitigate the Impact of Total Reflection in Liquid Film Imaging.

Ting Xue, Wenkang Zhang, Jinshun Liu

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2024

Interface Curvature Measurement of Liquid Film Based on SLIF.

Jinshun Liu, Ting Xue, Songlin Li

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2024

An Adaptive Algorithm for Bubble Identification and Visualization Utilizing Laser Scanning.

Songlin Li, Ting Xue, Jinshun Liu

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2024

2023

A Novel 3-D Reconstruction Method of Liquid Film Based on Scanning Laser-Induced Fluorescence.

Ting Xue, Jinshun Liu, Haoying Li

IEEE Trans. Instrum. Meas., 2023

2022

Investigation on Influencing Factors of Film Bubbles in Vertical Upward Annular Flow Based on Fluorescence Imaging.

Jinshun Liu, Ting Xue

IEEE Trans. Instrum. Meas., 2022

2020

Effect of liquid temperature on wave characteristics in falling film based on PLIF.

Ting Xue, Zhili Wang, Jinshun Liu

Proceedings of the 2020 IEEE International Instrumentation and Measurement Technology Conference, 2020

Investigation of Film Bubbles in Annular Flow Based on Planar Laser-induced Fluorescence.

Ting Xue, Jinshun Liu, Zhili Wang

Proceedings of the 2020 IEEE International Instrumentation and Measurement Technology Conference, 2020