Jon C. Lee

According to our database, Jon C. Lee authored at least 4 papers between 2001 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2009

A study of electrical characteristic changes in MOSFET by electron beam irradiation.

Yasuhiro Mitsui, Takeshi Sunaoshi, Jon C. Lee

Microelectron. Reliab., 2009

2003

A Novel Application of C-AFM: Deep Sub-micron Single Probing for IC Failure Analysis.

Jon C. Lee, J. H. Chuang

Microelectron. Reliab., 2003

2002

Investigation of Sensitivity Improvement on Passive Voltage Contrast for Defect Isolation.

Jon C. Lee, C. H. Chen, David Su, J. H. Chuang

Microelectron. Reliab., 2002

2001

A Novel Application of the FIB Lift-out Technique for 3-D TEM Analysis.

Jon C. Lee, David Su, J. H. Chuang

Microelectron. Reliab., 2001