Junzhe Kang
Orcid: 0000-0003-4322-0858
According to our database1,
Junzhe Kang
authored at least 2 papers
in 2024.
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Bibliography
2024
Impact of Lightly Doped Drain on Hot Carrier Degradation Variability in N-FETs and SRAM Cells.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Proceedings of the Device Research Conference, 2024