Kenneth A. Sudduth

According to our database, Kenneth A. Sudduth authored at least 10 papers between 2018 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2023

Developing an image processing pipeline to improve the position accuracy of single UAV images.

Aijing Feng, Chin Nee Vong, Jing Zhou, Lance S. Conway, Jianfeng Zhou, Earl Vories, Kenneth A. Sudduth, Newell R. Kitchen

Comput. Electron. Agric., March, 2023

2022

Extraction of reflectance spectra features for estimation of surface, subsurface, and profile soil properties.

Peng Zhou, Kenneth A. Sudduth, Kristen S. Veum, Minzan Li

Comput. Electron. Agric., 2022

Corn emergence uniformity estimation and mapping using UAV imagery and deep learning.

Chin Nee Vong, Lance S. Conway, Aijing Feng, Jianfeng Zhou, Newell R. Kitchen, Kenneth A. Sudduth

Comput. Electron. Agric., 2022

2021

Early corn stand count of different cropping systems using UAV-imagery and deep learning.

Chin Nee Vong, Lance S. Conway, Jianfeng Zhou, Newell R. Kitchen, Kenneth A. Sudduth

Comput. Electron. Agric., 2021

2020

Evaluation of Cotton Emergence Using UAV-Based Narrow-Band Spectral Imagery with Customized Image Alignment and Stitching Algorithms.

Aijing Feng, Jianfeng Zhou, Earl Vories, Kenneth A. Sudduth

Remote. Sens., 2020

AI Down on the Farm.

Kenneth A. Sudduth, M. Jennifer Woodward-Greene, Bryan W. Penning, Martin A. Locke, Adam R. Rivers, Kristen S. Veum

IT Prof., 2020

Evaluation of cotton emergence using UAV-based imagery and deep learning.

Aijing Feng, Jianfeng Zhou, Earl Vories, Kenneth A. Sudduth

Comput. Electron. Agric., 2020

2019

Improving In-Situ Estimation of Soil Profile Properties Using a Multi-Sensor Probe.

Xiaoshuai Pei, Kenneth A. Sudduth, Kristen S. Veum, Minzan Li

Sensors, 2019

Development of a multi-band sensor for crop temperature measurement.

Philip L. Drew, Kenneth A. Sudduth, E. John Sadler, Allen L. Thompson

Comput. Electron. Agric., 2019

2018

Predicting Profile Soil Properties with Reflectance Spectra via Bayesian Covariate-Assisted External Parameter Orthogonalization.

Kristen S. Veum, Paul A. Parker, Kenneth A. Sudduth, Scott H. Holan

Sensors, 2018