Kim Hong Yip

According to our database, Kim Hong Yip authored at least 1 paper in 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Application of Scanning Capacitance Microscopy on SOI device with wafer edge low yield pattern.

Changqing Chen, Ghim Boon Ang, Peng Tiong Ng, Francis Rivai, Soh Ping Neo, Dayanand Nagalingam, Kim Hong Yip, Jeffery Lam, Zhihong Mai

Microelectron. Reliab., 2017