Kunhee Tae
Orcid: 0009-0002-8938-4110Timeline
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Bibliography
2024
Retention Characteristics Dependent on High-κ Gate-Insulator Stack in Hf-ZnO Synaptic Thin-Film Transistors.
IEEE Access, 2024
Weight-Update Characteristics Dependent on Carrier Densities of Hf-ZnO Charge-Trap Layers in Sub-Threshold Synaptic Transistors.
IEEE Access, 2024