Loren W. Linholm

According to our database¹, Loren W. Linholm authored at least 1 paper in 2000.

Collaborative distances:

Dijkstra number² of six.
Erdős number³ of six.

Awards

IEEE Fellow

IEEE Fellow 1998, "For initiating and guiding the development of innovative microelectronic test-structure based measurement techniques, and associated parametric test-instrumentation procedures, for monitoring advanced semiconductor wafer-fabrication processes and tools.".