M. Hyozo

According to our database1, M. Hyozo authored at least 1 paper in 1990.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of six.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

1990
A fine pitch probe technology for VLSI wafer testing.
Proceedings of the Proceedings IEEE International Test Conference 1990, 1990


  Loading...