M. Kadi

According to our database, M. Kadi authored at least 2 papers between 2009 and 2010.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2010

Characteristics degradation of the SiGe HBT under electromagnetic field stress.

A. Alaeddine, M. Kadi, K. Daoud, B. Beydoun

Microelectron. Reliab., 2010

2009

Effects of electromagnetic near-field stress on SiGe HBT's reliability.

A. Alaeddine, M. Kadi, K. Daoud, B. Mazari

Microelectron. Reliab., 2009