M. Shafkat M. Khan
Orcid: 0000-0002-8532-8720
According to our database1,
M. Shafkat M. Khan
authored at least 5 papers
between 2022 and 2025.
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Bibliography
2025
Toward Standardized Vulnerability Assessment of Advanced Packaging Against Probing Attacks.
IEEE Des. Test, August, 2025
Inherent Hardware Identifiers: Advancing IC Traceability and Provenance in the Multi-Die Era.
J. Electron. Test., February, 2025
From Design to Inspection: Can Inspection-aware Design Enhance Reliability in Advanced Packaging?
Proceedings of the 43rd IEEE VLSI Test Symposium, 2025
2023
2022