M. Shafkat M. Khan
Orcid: 0000-0002-8532-8720
  According to our database1,
  M. Shafkat M. Khan
  authored at least 5 papers
  between 2022 and 2025.
  
  
Collaborative distances:
Collaborative distances:
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Bibliography
  2025
Toward Standardized Vulnerability Assessment of Advanced Packaging Against Probing Attacks.
    
  
    IEEE Des. Test, August, 2025
    
  
Inherent Hardware Identifiers: Advancing IC Traceability and Provenance in the Multi-Die Era.
    
  
    J. Electron. Test., February, 2025
    
  
From Design to Inspection: Can Inspection-aware Design Enhance Reliability in Advanced Packaging?
    
  
    Proceedings of the 43rd IEEE VLSI Test Symposium, 2025
    
  
  2023
  2022