M. Snyder

According to our database1, M. Snyder authored at least 2 papers in 1991.

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Bibliography

1991
High accelerated lifetime test methods and procedures for VLSI microcircuit interconnection line certification.
Proceedings of the 9th IEEE VLSI Test Symposium (VTS'91), 1991

Electromigration Effects in VLSI Due to Various Current Types.
Proceedings of the Proceedings IEEE International Test Conference 1991, 1991


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