Marcin Sadurski

According to our database, Marcin Sadurski authored at least 8 papers between 2024 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2025

Next-Gen Contextual Anomaly Detection for Sustainable and Efficient Production in Industry 4.0.

Kiavash Fathi, Marcin Sadurski, Stefan Waskow, Tobias Kleinert, Hans Wernher van de Venn

Proceedings of the Innovative Intelligent Industrial Production and Logistics, 2025

Recognizing and Integrating Legacy Assembly Diagrams into Industry 4.0.

Nico Braunisch, Daniyar Serikov, Marko Ristin, Björn Otto, Marcin Sadurski, Hans Wernher van de Venn, Martin Wollschlaeger

Proceedings of the 51st Annual Conference of the IEEE Industrial Electronics Society, 2025

Towards Industry 5.0: AAS/MLOps-Driven Model Maintenance for Data-Centric Production.

Kiavash Fathi, Marcin Sadurski, Stefan Waskow, Tobias Kleinert, Hans Wernher van de Venn

Proceedings of the 22nd International Conference on Informatics in Control, 2025

The link between programmable logic controllers and Industry 4.0 digital twins.

Nico Braunisch, Santiago Soler Perez Olaya, Tom Gneuß, Uwe Schmidt, Marko Ristin, Marcin Sadurski, Hans Wernher van de Venn, Martin Wollschlaeger

Proceedings of the 2025 5th International Conference on Electrical, 2025

Digital Twin in Industrie 4.0 Implementation for Embedded Systems.

Santiago Soler Perez Olaya, Dennis Cavegn, Nico Braunisch, Marko Ristin, Marcin Sadurski, Hans Wernher van de Venn, Martin Wollschlaeger

Proceedings of the 21st IEEE International Conference on Automation Science and Engineering, 2025

2024

Digital Twin in Industrie 4.0 for Embedded Systems.

Nico Braunisch, Santiago Soler Perez Olaya, Uwe Schmidt, Marko Ristin, Marcin Sadurski, Hans Wernher van de Venn, Martin Wollschlaeger

Proceedings of the 20th IEEE International Conference on Factory Communication Systems, 2024

Detection of Novel Asset Failures in Predictive Maintenance Using Classifier Certainty.

Kiavash Fathi, Marko Ristin, Marcin Sadurski, Tobias Kleinert, Hans Wernher van de Venn

Proceedings of the 32nd Mediterranean Conference on Control and Automation, 2024

Smart Factory Production Process Using Virtual Cost Optimization.

Kévin Grivet, Marcin Sadurski, Hans Wernher van de Venn

Proceedings of the IEEE International Conference on Industrial Technology, 2024