Martin Ying Song Lim
Orcid: 0009-0008-8010-5369
According to our database1,
Martin Ying Song Lim
authored at least 2 papers
between 2022 and 2025.
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Bibliography
2025
Wafer Region Yield Prediction: Employing Majority Under-Sampling and Output Binarization on Low-Yield Threshold.
IEEE Access, 2025
2022
Prediction of Wafer Map Categories Using Wafer Acceptance Test Parameters in Semiconductor Manufacturing.
Proceedings of the Artificial Intelligence Applications and Innovations, 2022