Matthew R. Maschmann

According to our database, Matthew R. Maschmann authored at least 14 papers between 2016 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Investigating the Electromechanical Sensitivity of Carbon-Nanotube-Coated Microfibers.

Elizabeth Bellott, Yushan Li, Connor Gunter, Scott Kovaleski, Matthew R. Maschmann

Sensors, 2023

Predicting Mechanical Properties of Carbon Nanotube (CNT) Images Using Multi-Layer Synthetic Finite Element Model Simulations.

Kaveh Safavigerdini, Koundinya Nouduri, Ramakrishna Surya, Andrew Reinhard, Zach Quinlan, Filiz Bunyak, Matthew R. Maschmann, Kannappan Palaniappan

Proceedings of the IEEE International Conference on Image Processing, 2023

CNT-NeRF: Carbon Nanotube Forest Depth Layer Decomposition in SEM Imagery using Generative Adversarial Networks.

Nguyen P. Nguyen, Ramakrishna Surya, Prasad Calyam, Kannappan Palaniappan, Matthew R. Maschmann, Filiz Bunyak

Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2023

Creating semi-Quanta multi-layer synthetic CNT images using CycleGAN.

Kaveh Safavigerdini, Ramakrishna Surya, Andrew Reinhard, Zach Quinlan, Filiz Bunyak, Matthew R. Maschmann, Kannappan Palaniappan

Proceedings of the 52nd IEEE Applied Imagery Pattern Recognition Workshop, 2023

Deep Style Transfer for Generation of Photo-realistic Synthetic Images of CNT Forests.

Prashanth Reddy Kotha, Minasadat Attari, Matthew R. Maschmann, Filiz Bunyak

Proceedings of the 52nd IEEE Applied Imagery Pattern Recognition Workshop, 2023

Towards Automated Nanoenergetic Reaction Characterization with Computational Vision.

Timothy B. Gaines, J. Alex Hurt, James M. Keller, Grant J. Scott, Camden I. Boyle, Matthew R. Maschmann, Stanton R. Price

Proceedings of the 52nd IEEE Applied Imagery Pattern Recognition Workshop, 2023

2022

Self-supervised Orientation-Guided Deep Network for Segmentation of Carbon Nanotubes in SEM Imagery.

Nguyen P. Nguyen, Ramakrishna Surya, Matthew R. Maschmann, Prasad Calyam, Kannappan Palaniappan, Filiz Bunyak

Proceedings of the Computer Vision - ECCV 2022 Workshops, 2022

Remote Instrumentation Science Environment for Intelligent Image Analytics.

Mauro Lemus Alarcon, Songjie Wang, Nguyen P. Nguyen, Ashish Pandey, Filiz Bunyak, Matthew R. Maschmann, Kannappan Palaniappan, Prasad Calyam

Proceedings of the 18th IEEE International Conference on e-Science, 2022

2021

Surface Plasmon Enhanced Fluorescence Temperature Mapping of Aluminum Nanoparticle Heated by Laser.

Naadaa Zakiyyan, Charles M. Darr, Biyan Chen, Cherian Mathai, Keshab Gangopadhyay, Jacob A. McFarland, Shubhra Gangopadhyay, Matthew R. Maschmann

Sensors, 2021

Reinforcement Learning based Carbon Nanotube Growth Automation.

Ashish Pandey, Ramakrishna Surya, Matthew R. Maschmann, Prasad Calyam

Proceedings of the 50th IEEE Applied Imagery Pattern Recognition Workshop, 2021

2020

Aiding Material Design Through Machine Learning.

Stanton R. Price, Christina H. Young, Matthew R. Maschmann, Steven R. Price

Proceedings of the 49th IEEE Applied Imagery Pattern Recognition Workshop, 2020

2019

Exploration of Carbon Nanotube Forest Synthesis-Structure Relationships Using Physics-Based Simulation and Machine Learning.

Taher Hajilounezhad, Zakariya A. Oraibi, Ramakrishna Surya, Filiz Bunyak, Matthew R. Maschmann, Prasad Calyam, Kannappan Palaniappan

Proceedings of the 48th IEEE Applied Imagery Pattern Recognition Workshop, 2019

2018

Single-molecule Imaging of Metallic Nanostructures on a Plasmonic Metal Grating Superlens.

Biyan Chen, Aaron Wood, Charles M. Darr, Sangho Bok, Keshab Gangopadhyay, Jacob A. McFarland, Matthew R. Maschmann, Shubhra Gangopadhyay

Proceedings of the IEEE International Conference on Bioinformatics and Biomedicine, 2018

2016

Fluorescence-based temperature sensor for in-situ imaging local temperature of aluminum nanoparticles on plasmonic gratings.

Biyan Chen, Haisheng Zheng, Junsang Yoon, Sangho Bok, Cherian Mathai, Keshab Gangopadhyay, Shubhra Gangopadhyay, Matthew R. Maschmann

Proceedings of the 2016 IEEE SENSORS, Orlando, FL, USA, October 30 - November 3, 2016, 2016