Mayank Kumar

Orcid: 0000-0001-9286-5666

Affiliations:
  • Adani Institute of Infrastructure Engineering, Ahmedabad, India
  • Motilal Nehru National Institute of Technology, Allahabad, India (PhD 2017)


According to our database1, Mayank Kumar authored at least 12 papers between 2015 and 2026.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of six.

Timeline

Legend:

Book  In proceedings  Article  PhD thesis  Dataset  Other 

Links

Online presence:

On csauthors.net:

Bibliography

2026
High-Gain Fault-Tolerant Multiport Bidirectional DC-DC Converter With Time Multiplexing Control.
Int. J. Circuit Theory Appl., 2026

Modeling of Multiport DC-DC Converter With Improved Fault-Tolerant Capability and Minimized Current Ripple Considering Circuit Parasitic.
Int. J. Circuit Theory Appl., 2026

2024
Detection and Localization of Open Switch Faults for Level-Shifted PWM Cascaded H-Bridge Inverter.
IEEE Trans. Circuits Syst. II Express Briefs, April, 2024

2021
Open Circuit Fault Detection and Switch Identification for LS-PWM H-Bridge Inverter.
IEEE Trans. Circuits Syst. II Express Briefs, 2021

A fault-diagnosis and tolerant control technique for five-level cascaded H-bridge inverters.
IET Circuits Devices Syst., 2021

2018
Time-Domain Characterization of Digitized PWM Inverter With Dead-Time Effect.
IEEE Trans. Circuits Syst. I Regul. Pap., 2018

2017
Sampled-Time-Domain Analysis of a Digitally Implemented Current Controlled Inverter.
IEEE Trans. Ind. Electron., 2017

2016
Sampling Effect Characterization of Digital SPWM of VSI in Time Domain.
IEEE Trans. Ind. Electron., 2016

Stability and Sensitivity Analysis of Uniformly Sampled DC-DC Converter With Circuit Parasitics.
IEEE Trans. Circuits Syst. I Regul. Pap., 2016

Sampled time domain analysis of digital pulse width modulation for feedback controlled converters.
IET Circuits Devices Syst., 2016

2015
Time-Domain Analysis of Sampling Effect in DPWM of DC-DC Converters.
IEEE Trans. Ind. Electron., 2015

A Novel Soft Switched Cycloinverter.
IEEE Trans. Ind. Electron., 2015


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