Michael Ion
Orcid: 0000-0001-5364-5556
According to our database1,
Michael Ion authored at least 2 papers
between 2020 and 2026.
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Bibliography
2026
Measuring Simulation Fidelity via Statistical Detectability: A Diagnostic Framework for AI-Generated Tutoring Conversations.
Proceedings of the Thirteenth ACM Conference on Learning @ Scale, 2026
2020
Proceedings of the SAC '20: The 35th ACM/SIGAPP Symposium on Applied Computing, online event, [Brno, Czech Republic], March 30, 2020