Miguel Sofo Haro

According to our database, Miguel Sofo Haro authored at least 7 papers between 2017 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2025

Automating Sensor Characterization with Bayesian Optimization.

J. Cuevas-Zepeda, C. Chavez, Juan Estrada, J. Noonan, Brian Nord, N. Saffold, Miguel Sofo Haro, R. Spinola e Castro, Shubhendu Trivedi

CoRR, September, 2025

2023

A Sub-Electron-Noise Multi-Channel Cryogenic Skipper-CCD Readout ASIC.

Fabricio Alcalde Bessia, Troy D. England, Hongzhi Sun, Leandro Stefanazzi, Davide Braga, Miguel Sofo Haro, Shaorui Li, Juan Estrada, Farah Fahim

IEEE Trans. Circuits Syst. I Regul. Pap., 2023

2022

Multiplexed Readout for an Experiment with a Large Number of Channels Using Single-Electron Sensitivity Skipper-CCDs.

Claudio R. Chavez, Fernando Chierchie, Miguel Sofo Haro, José Lipovetzky, Guillermo Fernandez Moroni, Juan Estrada

Sensors, 2022

2020

Interleaved Readout of Charge-Coupled Devices (CCDs) for Correlated Noise Reduction.

Guillermo Fernandez Moroni, Fernando Chierchie, Leandro Stefanazzi, Eduardo Emilio Paolini, Miguel Sofo Haro, Gustavo Cancelo, Javier Tiffenberg, Juan Estrada

IEEE Trans. Instrum. Meas., 2020

Detailed modeling of the video signal and optimal readout of charge-coupled devices.

Fernando Chierchie, Guillermo Fernandez Moroni, Pedro Querejeta Simbeni, Leandro Stefanazzi, Eduardo E. Paolini, Miguel Sofo Haro, Gustavo Cancelo, Juan Estrada

Int. J. Circuit Theory Appl., 2020

2018

X-ray micrographic imaging system based on COTS CMOS sensors.

Fabricio Alcalde Bessia, Martin Pérez, José Lipovetzky, Natalia Alejandra Piunno, Horacio Mateos, Iván Sidelnik, Juan Jerónimo Blostein, Miguel Sofo Haro, Mariano Gómez Berisso

Int. J. Circuit Theory Appl., 2018

2017

Aspects on the shape dependence with energy of point-like events in high resistivity CCDs.

Guillermo Fernandez Moroni, Miguel Sofo Haro, Javier Tiffenberg, Eduardo E. Paolini, Juan Estrada, Xavier Bertou, Gustavo Cancelo

Proceedings of the 8th IEEE Latin American Symposium on Circuits & Systems, 2017