Minkyo Suh
Orcid: 0009-0004-9234-1618Timeline
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Bibliography
2025
Improvement of Erase Performance Using p-Type Gate in IGZO Channel-Based 3D NAND Flash.
IEEE Access, 2025
Development of High Density 3D NAND Flash Memory Using New Scaling Technologies for AI Semiconductor.
Proceedings of the IEEE International Conference on Consumer Electronics, 2025