Naoki Kuramoto

Orcid: 0000-0002-4375-5214

According to our database1, Naoki Kuramoto authored at least 25 papers between 2003 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2022
Finite-Element Simulation of Effect of Surface Roughness of Coaxial Cylindrical Electrodes on Small Mass and Force Measurements Using Voltage Balance Apparatus.
IEEE Trans. Instrum. Meas., 2022

Investigating Stability of Si Sphere Surface Layer in Ambient-Vacuum Cyclic Measurements Using Ellipsometry.
IEEE Trans. Instrum. Meas., 2022

2021
XPS Analysis of a <sup>28</sup>Si-Enriched Sphere for Realization of the Kilogram.
IEEE Trans. Instrum. Meas., 2021

Volume Measurement of a <sup>28</sup>Si-Enriched Sphere to Realize the Kilogram Based on the Planck Constant at NMIJ.
IEEE Trans. Instrum. Meas., 2021

Determination of Defect Concentrations in ²⁸Si Crystals Using EPR for the Realization of the Kilogram.
IEEE Trans. Instrum. Meas., 2021

Reproducibility of the Realization of the Kilogram Based on the Planck Constant by the XRCD Method at NMIJ.
IEEE Trans. Instrum. Meas., 2021

Verifying the Reliability of a Voltage Balance Apparatus to Measure Small Mass and Force Standards at NMIJ.
IEEE Trans. Instrum. Meas., 2021

2019
Electron Paramagnetic Resonance Study on <sup>28</sup>Si Single Crystal for the Future Realization of the Kilogram.
IEEE Trans. Instrum. Meas., 2019

Volume Measurement of a <sup>28</sup>Si-Enriched Sphere for a Determination of the Avogadro Constant at NMIJ.
IEEE Trans. Instrum. Meas., 2019

2017
Thickness Measurement of Oxide and Carbonaceous Layers on a <sup>28</sup>Si Sphere by XPS.
IEEE Trans. Instrum. Meas., 2017

Uniformity Evaluation of Lattice Spacing of <sup>28</sup>Si Single Crystals.
IEEE Trans. Instrum. Meas., 2017

Mass Measurement of <sup>28</sup>Si-Enriched Spheres at NMIJ for the Determination of the Avogadro Constant.
IEEE Trans. Instrum. Meas., 2017

Realization of the Kilogram Based on the Planck Constant at NMIJ.
IEEE Trans. Instrum. Meas., 2017

Surface Layer Analysis of a <sup>28</sup>Si-Enriched Sphere Both in Vacuum and in Air by Ellipsometry.
IEEE Trans. Instrum. Meas., 2017

2015
Surface Layer Analysis of Si Sphere by XRF and XPS.
IEEE Trans. Instrum. Meas., 2015

Homogeneity Characterization of Lattice Spacing of Silicon Single Crystals.
IEEE Trans. Instrum. Meas., 2015

Mass Measurement of 1-kg Silicon Spheres for Determination of the Avogadro and Planck Constants.
IEEE Trans. Instrum. Meas., 2015

Improvements to the Volume Measurement of <sup>28</sup>Si Spheres to Determine the Avogadro Constant.
IEEE Trans. Instrum. Meas., 2015

2011
Diameter Comparison of a Silicon Sphere for the International Avogadro Coordination Project.
IEEE Trans. Instrum. Meas., 2011

2009
Improvement in the Volume Determination for Si Spheres With an Optical Interferometer.
IEEE Trans. Instrum. Meas., 2009

2007
Density Determination of Silicon Spheres Using an Interferometer With Optical Frequency Tuning.
IEEE Trans. Instrum. Meas., 2007

2005
Volume determination of a silicon sphere using an improved interferometer with optical frequency tuning.
IEEE Trans. Instrum. Meas., 2005

Present State of the avogadro constant determination from silicon Crystals with natural isotopic compositions.
IEEE Trans. Instrum. Meas., 2005

2003
Interferometric determination of the diameter of a silicon sphere using a direct optical frequency tuning system.
IEEE Trans. Instrum. Meas., 2003

Evaluation of the molar volume of silicon crystals for a determination of the Avogadro constant.
IEEE Trans. Instrum. Meas., 2003


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