Nian Yang

Orcid: 0000-0002-5451-2824

According to our database1, Nian Yang authored at least 11 papers between 2001 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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Links

On csauthors.net:

Bibliography

2023
Asymptotics for the survival probability of time-inhomogeneous diffusion processes.
Oper. Res. Lett., May, 2023

2022
Multilevel field-split preconditioners with domain decomposition for steady and unsteady flow problems.
Comput. Phys. Commun., 2022

2021
Research on the Innovation of Educational Management of Middle and University Students in the New Media Vision.
Proceedings of the ICISCAE 2021: 4th International Conference on Information Systems and Computer Aided Education, Dalian, China, September 24, 2021

The Theory and Practice of Online and Offline Integrated Teaching Mode in Colleges and Universities under the Background of "Internet +".
Proceedings of the ICISCAE 2021: 4th International Conference on Information Systems and Computer Aided Education, Dalian, China, September 24, 2021

2019
Energy efficient network localisation using hybrid TOA/AOA measurements.
IET Commun., 2019

Simultaneous measurement of refractive index and temperature based on reflective LPG-FBGs.
Proceedings of the 2019 24th OptoElectronics and Communications Conference (OECC) and 2019 International Conference on Photonics in Switching and Computing (PSC), 2019

2017
Virtual grid margin optimization and energy balancing scheme for mobile sinks in wireless sensor networks.
Multim. Tools Appl., 2017

A GMM-Based User Model for Knowledge Recommendation.
Proceedings of the 3rd IEEE International Conference on Cybernetics, 2017

2016
CoDA: Collaborative Data Aggregation in Emerging Sensor Networks Using Bio-Level Voronoi Diagrams.
Sensors, 2016

2013
Low Carbon Economy Evaluation Index System and Development Evaluation of Hebei.
Proceedings of the Sixth International Conference on Business Intelligence and Financial Engineering, 2013

2001
A study of the effects of tunneling currents and reliability of sub-2 nm gate oxides on scaled n-MOSFETs.
Microelectron. Reliab., 2001


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