Nicholas G. Paulter Jr.
Affiliations:- National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA
According to our database1,
Nicholas G. Paulter Jr.
authored at least 34 papers
between 1998 and 2022.
Collaborative distances:
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on nist.gov
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Bibliography
2022
The IEEE Technical Committee 10-The Waveform Generation, Measurement, and Analysis Committee: Update 2021.
IEEE Instrum. Meas. Mag., 2022
2021
J. Percept. Imaging, 2021
The IEEE Technical Committee 10: The Waveform Generation, Measurement, and Analysis Committee.
IEEE Instrum. Meas. Mag., 2021
2020
IEEE Instrum. Meas. Mag., 2020
Proceedings of the 2020 IEEE International Joint Conference on Biometrics, 2020
Electrostatically Induced Voltage in Metal Box When Charged Object Like Hand Moves Away from the Box to Three Directions.
Proceedings of the IEEE Industry Applications Society Annual Meeting, 2020
2019
Predicting Detection Performance on Security X-Ray Images as a Function of Image Quality.
IEEE Trans. Image Process., 2019
2018
IEEE Trans. Inf. Forensics Secur., 2018
2017
IEEE Trans. Inf. Forensics Secur., 2017
Proceedings of the International Conference of the Biometrics Special Interest Group, 2017
2016
IEEE Trans. Inf. Forensics Secur., 2016
Proceedings of the 2016 International Conference of the Biometrics Special Interest Group, 2016
2015
Proceedings of the 2015 IEEE Global Conference on Signal and Information Processing, 2015
2014
Proceedings of the 22nd International Conference on Pattern Recognition, 2014
2013
Proceedings of the International Conference on Biometrics, 2013
The forthcoming IEEE standard 1696 on test methods for characterizing circuit probes.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2013
2012
Proceedings of the IEEE Fifth International Conference on Biometrics: Theory, 2012
2007
Uncertainty in the Nose-to-Nose Sampler Calibration Method Due to the Assertion That the Generator and Receiver Functions Are Identical.
IEEE Trans. Instrum. Meas., 2007
Impedance of Transfer Standards Used in the Calibration of High-Speed Samplers and Pulse Generators.
IEEE Trans. Instrum. Meas., 2007
2005
IEEE Trans. Instrum. Meas., 2005
2004
IEEE Trans. Instrum. Meas., 2004
2003
IEEE Trans. Instrum. Meas., 2003
IEEE Trans. Instrum. Meas., 2003
2001
An examination of the spectra of the "Kick-Out" pulses for a proposed sampling oscilloscope calibration method.
IEEE Trans. Instrum. Meas., 2001
An assessment on the accuracy of time-domain reflectometry for measuring the characteristic impedance of transmission lines.
IEEE Trans. Instrum. Meas., 2001
The effects of offset voltage on the amplitude and bandwidth of kick-out pulses used in the nose-to-nose sampler impulse response characterization method.
IEEE Trans. Instrum. Meas., 2001
1998
Long-term repeatability of a TDR-based printed wiring board dielectric constant measurement system.
IEEE Trans. Instrum. Meas., 1998
IEEE Trans. Instrum. Meas., 1998
Low-jitter trigger system for pulse calibration and intercomparison of high-speed samplers.
IEEE Trans. Instrum. Meas., 1998