Owain Parry

According to our database, Owain Parry authored at least 13 papers between 2020 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2025

Summary of the 2nd International Flaky Test Workshop (FTW 2025).

Martin Gruber, Wing Lam, Owain Parry, August Shi

ACM SIGSOFT Softw. Eng. Notes, October, 2025

Foreword to the 2nd International Flaky Tests Workshop 2025 (FTW 2025).

Martin Gruber, Wing Lam, Owain Parry, August Shi

Proceedings of the IEEE/ACM International Flaky Tests Workshop, 2025

QAOA-PCA: Enhancing Efficiency in the Quantum Approximate Optimization Algorithm via Principal Component Analysis.

Owain Parry, Phil McMinn

Proceedings of the 2025 29th International Conference on Evaluation and Assessment in Software Engineering Companion, 2025

Systemic Flakiness: An Empirical Analysis of Co-Occurring Flaky Test Failures.

Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn

Proceedings of the 29th International Conference on Evaluation and Assessment in Software Engineering, 2025

2024

Summary of the 1st International Flaky Test Workshop (FTW 2024).

Owain Parry, Martin Gruber, Tim A. D. Henderson, Phil McMinn, Gordon Fraser

ACM SIGSOFT Softw. Eng. Notes, July, 2024

Improving the Reliability of Quantum Circuits by Evolving Heterogeneous Ensembles.

Owain Parry, John Clark, Phil McMinn

CoRR, 2024

Do Automatic Test Generation Tools Generate Flaky Tests?

Martin Gruber, Muhammad Firhard Roslan, Owain Parry, Fabian Scharnböck, Phil McMinn, Gordon Fraser

Proceedings of the 46th IEEE/ACM International Conference on Software Engineering, 2024

2023

Empirically evaluating flaky test detection techniques combining test case rerunning and machine learning models.

Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn

Empir. Softw. Eng., June, 2023

2022

A Survey of Flaky Tests.

Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn

ACM Trans. Softw. Eng. Methodol., 2022

Evaluating Features for Machine Learning Detection of Order- and Non-Order-Dependent Flaky Tests.

Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn

Proceedings of the 15th IEEE Conference on Software Testing, Verification and Validation, 2022

Surveying the Developer Experience of Flaky Tests.

Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn

Proceedings of the 44th IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice, 2022

What Do Developer-Repaired Flaky Tests Tell Us About the Effectiveness of Automated Flaky Test Detection?

Owain Parry, Michael Hilton, Gregory M. Kapfhammer, Phil McMinn

Proceedings of the IEEE/ACM International Conference on Automation of Software Test, 2022

2020

Flake It 'Till You Make It: Using Automated Repair to Induce and Fix Latent Test Flakiness.

Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn

Proceedings of the ICSE '20: 42nd International Conference on Software Engineering, Workshops, Seoul, Republic of Korea, 27 June, 2020