Pan Yan
According to our database1,
Pan Yan authored at least 9 papers
between 2008 and 2026.
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Bibliography
2026
WaferIntel: A Lightweight, SME-Driven Framework for Advanced Defect Pattern Analysis.
Proceedings of the 44th IEEE VLSI Test Symposium, 2026
2025
Accuracy analysis and optimization of scale-independent third-order WENO-Z scheme with critical-point accuracy preservation.
CoRR, September, 2025
2022
CoRR, 2022
2021
On Developing Piecewise Rational Mapping with Fine Regulation Capability for WENO Schemes.
J. Sci. Comput., 2021
CoRR, 2021
Third-order scale-independent WENO-Z scheme achieving optimal order at critical points.
CoRR, 2021
On developing piecewise rational mapping with fine regulation capability for WENO schemes.
CoRR, 2021
2016
IEEE Trans. Image Process., 2016
2008
Proceedings of the Fifth International Conference on Fuzzy Systems and Knowledge Discovery, 2008