Phillippe Goudeau

Orcid: 0000-0001-8894-0846

According to our database¹, Phillippe Goudeau authored at least 1 paper in 2003.

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2003

Correlation between X-ray micro-diffraction and a developed analytical model to measure the residual stresses in suspended structures in MEMS.

[DOI]

Microelectron. Reliab., 2003