Piotr Szyperski
Orcid: 0000-0003-0385-7053
According to our database1,
Piotr Szyperski
authored at least 2 papers
between 2015 and 2020.
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Bibliography
2020
New Approaches to Fractal Dimension Estimation With Application to Gray-Scale Images.
IEEE Access, 2020
2015
A Novel Phase-Based Approach to Tear Film Surface Quality Assessment Using Lateral Shearing Interferometry.
Proceedings of the Computer Information Systems and Industrial Management, 2015