Q. Peter He

According to our database1, Q. Peter He authored at least 17 papers between 2007 and 2020.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2020
Feature engineering in big data analytics for IoT-enabled smart manufacturing - Comparison between deep learning and statistical learning.
Comput. Chem. Eng., 2020

Using Channel State Information for Estimating Moisture Content in Woodchips via 5 GHz Wi-Fi.
Proceedings of the 2020 American Control Conference, 2020

A Variable Selection Method for Improving Variable Selection Consistency and Soft Sensor Performance.
Proceedings of the 2020 American Control Conference, 2020

2019
Next-generation virtual metrology for semiconductor manufacturing: A feature-based framework.
Comput. Chem. Eng., 2019

Understanding the effect of specialization on hospital performance through knowledge-guided machine learning.
Comput. Chem. Eng., 2019

Feature space monitoring for smart manufacturing via statistics pattern analysis.
Comput. Chem. Eng., 2019

A novel process monitoring approach based on variational recurrent autoencoder.
Comput. Chem. Eng., 2019

2017
A new application of data-driven soft sensor: Estimating individual biomass in mixed cultures.
Proceedings of the 2017 American Control Conference, 2017

Statistical process monitoring in the era of smart manufacturing.
Proceedings of the 2017 American Control Conference, 2017

2013
Improved state estimation for high-mix semiconductor manufacturing.
Proceedings of the American Control Conference, 2013

Elucidating xylose metabolism of scheffersomyces stipitis by integrating principal component analysis with flux balance analysis.
Proceedings of the American Control Conference, 2013

Quantification of valve stiction based on a semi-physical model.
Proceedings of the American Control Conference, 2013

2010
Comparison of a new spectrum alignment algorithm with other methods.
Proceedings of the American Control Conference, 2010

2008
EWMA run-to-run controllers with gain updating: Stability and sensitivity analysis.
Proceedings of the American Control Conference, 2008

Principal component based k-nearest-neighbor rule for semiconductor process fault detection.
Proceedings of the American Control Conference, 2008

2007
Run-to-run control and state estimation in high-mix semiconductor manufacturing.
Annu. Rev. Control., 2007

A General Framework for State Estimation in High-Mix Semiconductor Manufacturing.
Proceedings of the American Control Conference, 2007


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