Ramez Nachman

According to our database1, Ramez Nachman authored at least 1 paper in 2005.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of five.

Timeline

Legend:

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PhD thesis 
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Links

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Bibliography

2005
The impact of PMOST bias-temperature degradation on logic circuit reliability performance.
Microelectron. Reliab., 2005


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