Ramón Jesús Sánchez Peñaloza

According to our database, Ramón Jesús Sánchez Peñaloza authored at least 1 paper in 2026.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of six.

2026

Vision-based wafer inspection in semiconductor manufacturing: a case study on scratch defect detection using synthetic data and YOLO models.

Ramón Jesús Sánchez Peñaloza, Armin Moghadam, Fatemeh Davoudi Kakhki

Int. J. Data Sci. Anal., December, 2026