Ravi J. N
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Bibliography
2025
'Shifting-left' Zero Defect Scan Test Development to Launch Automotive PPM-ready Products.
Proceedings of the IEEE International Test Conference, 2025
LA-DOS: Layout-Aware-Defect-Oriented Stress UDFM & ATPG Pattern Generation for Zero Defect Automotive Designs.
Proceedings of the IEEE International Test Conference, 2025