Robert Baumann
Orcid: 0000-0002-8589-4685
According to our database1,
Robert Baumann
authored at least 3 papers
between 2003 and 2024.
Collaborative distances:
Collaborative distances:
Awards
IEEE Fellow
IEEE Fellow 2005, "For contributions to the understanding of the reliability impact of terrestrial radiation mechanisms in commercial electronics.".
Timeline
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Bibliography
2024
Data publication: Boosting electrode performance and bubble management via Direct Laser Interference Patterning.
Dataset, October, 2024
2005
2003
Technology Scaling Trends and Accelerated Testing for Soft Errors in Commercial Silicon Devices.
Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003