Robert Baumann

Orcid: 0000-0002-8589-4685

According to our database1, Robert Baumann authored at least 3 papers between 2003 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Awards

IEEE Fellow

IEEE Fellow 2005, "For contributions to the understanding of the reliability impact of terrestrial radiation mechanisms in commercial electronics.".

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2024
Data publication: Boosting electrode performance and bubble management via Direct Laser Interference Patterning.
Dataset, October, 2024

2005
Soft Errors in Advanced Computer Systems.
IEEE Des. Test Comput., 2005

2003
Technology Scaling Trends and Accelerated Testing for Soft Errors in Commercial Silicon Devices.
Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003


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