Roberto Nicolosi

According to our database, Roberto Nicolosi authored at least 1 paper in 2012.

Collaborative distances:

• Dijkstra number of seven.
• Erdős number of six.

2012

Catastrophic flip-chip failures at thermal cycles caused by micro-cracks in passivation layer, present only in the spacing between minimum width stripes of last metal level.

Rosa Lucia Torrisi, Vittorio Maiorana, Roberto Nicolosi, Giovanni Presti

Microelectron. Reliab., 2012