Rui Zhang

Orcid: 0000-0003-1361-5023

Affiliations:
  • Beihang University, School of Reliability and Systems Engineering, Beijing, China


According to our database1, Rui Zhang authored at least 1 paper in 2019.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Bibliography

2019
Study of single event transient induced by heavy-ion in NMOS transistor and CMOS inverter.
Concurr. Comput. Pract. Exp., 2019


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