Ryan Dehoff

According to our database, Ryan Dehoff authored at least 6 papers between 2016 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Deep-Learning Quantitative Structural Characterization in Additive Manufacturing.

Amra Peles, Vincent C. Paquit, Ryan R. Dehoff

CoRR, 2023

Deep Learning Based Workflow for Accelerated Industrial X-Ray Computed Tomography.

Obaidullah Rahman, Singanallur V. Venkatakrishnan, Luke Scime, Paul Brackman, Curtis Frederick, Ryan Dehoff, Vincent C. Paquit, Amirkoushyar Ziabari

Proceedings of the IEEE International Conference on Image Processing, 2023

2022

Simurgh: A Framework for Cad-Driven Deep Learning Based X-Ray CT Reconstruction.

Amirkoushyar Ziabari, Singanallur V. Venkatakrishnan, Abhishek Dubey, Alex Lisovich, Paul Brackman, Curtis Frederick, Pradeep Bhattad, Philip R. Bingham, Alex Plotkowski, Ryan Dehoff, Vincent C. Paquit

Proceedings of the 2022 IEEE International Conference on Image Processing, 2022

2017

Characterization of Crystallographic Structures Using Bragg-Edge Neutron Imaging at the Spallation Neutron Source.

Gian Song, Jiao Y. Y. Lin, Jean C. Bilheux, Qingge Xie, Louis Joseph Santodonato, Jamie J. Molaison, Harley D. Skorpenske, Antonio M. Dos Santos, Chris A. Tulk, Ke An, Alexandru D. Stoica, Michael M. Kirka, Ryan R. Dehoff, Anton S. Tremsin, Jeffrey Bunn, Lindsay M. Sochalski-Kolbus, Hassina Z. Bilheux

J. Imaging, 2017

Falcon: Visual analysis of large, irregularly sampled, and multivariate time series data in additive manufacturing.

Chad A. Steed, William Halsey, Ryan Dehoff, Sean L. Yoder, Vincent C. Paquit, Sarah Powers

Comput. Graph., 2017

2016

Segmented time series visualization tool for additive manufacturing.

William Halsey, Chad A. Steed, Ryan Dehoff, Vincent C. Paquit, Sean L. Yoder

Proceedings of the 6th IEEE Symposium on Large Data Analysis and Visualization, 2016