Ryozou Yoshino

According to our database, Ryozou Yoshino authored at least 3 papers between 1985 and 1995.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

1995

A Gate-Array-Based 666MHz VLSI Test System.

Shuji Kikuchi, Yoshihiko Hayashi, Takashi Suga, Jun Saitou, Masahiko Kaneko, Takashi Matsumoto, Ryozou Yoshino

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1989

A 250 MHz Shared-Resource VLSI Test System with High Pin Count and Memory Test Capability.

Shuji Kikuchi, Yoshihiko Hayashi, Takashi Matsumoto, Ryozou Yoshino, Ryuichi Takagi

Proceedings of the Proceedings International Test Conference 1989, 1989

1985

Custom VLSI Test System.

Ryozou Yoshino, Ryuichi Takagi

Proceedings of the Proceedings International Test Conference 1985, 1985