S. Patra
Orcid: 0009-0007-7789-6916
According to our database1,
S. Patra authored at least 2 papers
between 2022 and 2026.
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Bibliography
2026
Comput. Appl. Math., August, 2026
2022
A Novel Approach for Assessing Impact of Temperature Hot-Spots on Chip-Package Interaction Reliability.
Proceedings of the IEEE International Reliability Physics Symposium, 2022