S. Pinarello

According to our database¹, S. Pinarello authored at least 2 papers between 2014 and 2015.

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2015

Impact of DC and RF non-conducting stress on nMOS reliability.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

MOSFET degradation under DC and RF Fowler-Nordheim stress.

[BibT_eX]

[DOI]

Proceedings of the 44th European Solid State Device Research Conference, 2014