SB. Ko

According to our database, SB. Ko authored at least 3 papers between 2024 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

Novel Linear Model for OFF-State Stress Causing Stand-By Current of Advanced VNAND Chip.

H. Park, G.-J. Kim, N.-J. Kim, J. Ahn, T. You, Y. Kang, M. Yoon, S. Lee, N.-H. Lee, S. Hwang, YC Hwang, SB. Ko, S. Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2025

A Critical Investigation of Hot Carrier Degradation in Low VTNMOSFETs in DRAM.

N. Choudhury, S. Lee, D. Son, G. Yang, G.-J. Kim, N.-H. Lee, Y. C. Hwang, SB. Ko, S. Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2025

2024

Effect of Off-State Stress on Data-Valid Window Margin for Advanced DRAM Using HK/MG Process Technology.

Sunhang Lee, Nam-Hyun Lee, G.-J. Kim, J. Ahn, Ik-Hwan Kim, S. Ha, S. Rhee, GH Bae, KW Lee, YS Lee, SB. Ko, S. Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2024