Shanyong Chen
Orcid: 0009-0002-3313-8025
According to our database1,
Shanyong Chen authored at least 3 papers
between 2024 and 2026.
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Bibliography
2026
Optimal design of constant stress accelerated degradation tests for high reliability chips.
Microelectron. J., 2026
2025
J. Intell. Manuf., August, 2025
2024
Schlieren measurements of shock train flow fields in a supersonic cylindrical isolator at Mach 2.
J. Vis., December, 2024