Shinwook Kim

Orcid: 0009-0004-3052-1293

According to our database¹, Shinwook Kim authored at least 10 papers between 2025 and 2026.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of five.

Timeline

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On csauthors.net:

Bibliography

2026

Prediction of Dynamic Random Access Memory Leakage Current Based Artificial Intelligence Model.

[BibT_eX]

[DOI]

Proceedings of the International Conference on Artificial Intelligence in Information and Communication, 2026

Prediction of Trap Behavior Under Repetitive Short-Circuit Stress in Sic MOSFETs Using Physics-Informed Gaussian Process Regressions.

[BibT_eX]

[DOI]

Proceedings of the International Conference on Artificial Intelligence in Information and Communication, 2026

Machine Learning-Based Optimization of Boosted Voltage in 3T Gain Cell eDRAM.

[BibT_eX]

[DOI]

Proceedings of the International Conference on Artificial Intelligence in Information and Communication, 2026

SHAP-Based Data-Driven Analysis of an Offset-Canceling Sense Amplifier in DRAMs.

[BibT_eX]

[DOI]

Proceedings of the International Conference on Artificial Intelligence in Information and Communication, 2026

Gate-Voltage-Conditioned Leakage-Aware Drain Current Prediction in BCAT Using Support Vector Regression.

[BibT_eX]

[DOI]

Proceedings of the International Conference on Artificial Intelligence in Information and Communication, 2026

Passing Word Line Row Hammering in DRAM via AI-Assisted Pi-BCAT Structure.

[BibT_eX]

[DOI]

Proceedings of the International Conference on Artificial Intelligence in Information and Communication, 2026

Deep Learning-Based Pareto Optimization Framework for LDMOS Transistors.

[BibT_eX]

[DOI]

Proceedings of the International Conference on Artificial Intelligence in Information and Communication, 2026

Design of a 3.5kW Low-Noise Current-Fed Converter for High-Integrity Data in AI-Based SOFC Systems.

[BibT_eX]

[DOI]

Proceedings of the International Conference on Artificial Intelligence in Information and Communication, 2026

Prediction of Single Event Upset-Induced Drain Peak Current Using Machine Learning.

[BibT_eX]

[DOI]

Proceedings of the International Conference on Artificial Intelligence in Information and Communication, 2026

2025

Enhancing Design Stability and Flexibility in Partial Isolation Type LDMOS.

[BibT_eX]

[DOI]

IEEE Access, 2025

Shinwook Kim

Timeline

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On csauthors.net:

Bibliography

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