Silvia Brazzelli
According to our database1,
Silvia Brazzelli
authored at least 2 papers
between 2023 and 2025.
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Bibliography
2025
Hot-Hole Gate Current and Degradation in N-Type Lateral Drift MOSFETs: Characterization and TCAD Analysis.
Proceedings of the IEEE International Reliability Physics Symposium, 2025
2023
Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023