Stephen B. Vardeman

Orcid: 0000-0001-5481-9423

According to our database1, Stephen B. Vardeman authored at least 19 papers between 1981 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2023
Real-Time Personalized Physiologically Based Stress Detection for Hazardous Operations.
IEEE Access, 2023

2022
Some Bayesian biclustering methods: Modeling and inference.
Stat. Anal. Data Min., 2022

2021
Modeling and inference for mixtures of simple symmetric exponential families of -dimensional distributions for vectors with binary coordinates.
Stat. Anal. Data Min., 2021

2020
Biclustering with missing data.
Inf. Sci., 2020

2019
Properties and Bayesian fitting of restricted Boltzmann machines.
Stat. Anal. Data Min., 2019

biclustermd: An R Package for Biclustering with Missing Values.
R J., 2019

2016
Bayesian Inference for a New Class of Distributions on Equivalence Classes of Three-Dimensional Orientations With Applications to Materials Science.
Technometrics, 2016

On the propriety of restricted Boltzmann machines.
CoRR, 2016

2014
One-sample Bayes inference for symmetric distributions of 3-D rotations.
Comput. Stat. Data Anal., 2014

2013
Bayes Statistical Analyses for Particle Sieving Studies.
Technometrics, 2013

2011
Modeling Spectral-Temporal Data From Point Source Events.
Technometrics, 2011

2010
Finite-sample investigation of likelihood and Bayes inference for the symmetric von Mises-Fisher distribution.
Comput. Stat. Data Anal., 2010

2006
Hierarchical Bayesian Statistical Analysis for a Calibration Experiment.
IEEE Trans. Instrum. Meas., 2006

2005
Likelihood-based statistical estimation from quantized data.
IEEE Trans. Instrum. Meas., 2005

Sheppard's correction for variances and the "quantization noise model".
IEEE Trans. Instrum. Meas., 2005

2000
Introduction to Two Classics in Statistical Process Control.
Technometrics, 2000

1999
Two-Way Random-Effects Analyses and Gauge R&R Studies.
Technometrics, 1999

1996
Development test programs for 1-shot systems: 2-state reliability and binary development-test results.
IEEE Trans. Reliab., 1996

1981
Contextual classification of multispectral image data.
Pattern Recognit., 1981


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