Steve Cruz

According to our database, Steve Cruz authored at least 16 papers between 2017 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

Agglomerative Clustering with Threshold Optimization via Extreme Value Theory.

Chunchun Li, Manuel Günther, Akshay Raj Dhamija, Steve Cruz, Mohsen Jafarzadeh, Touqeer Ahmad, Terrance E. Boult

Algorithms, 2022

Enhanced Performance of Pre-Trained Networks by Matched Augmentation Distributions.

Touqeer Ahmad, Mohsen Jafarzadeh, Akshay Raj Dhamija, Ryan Rabinowitz, Steve Cruz, Chunchun Li, Terrance E. Boult

Proceedings of the International Joint Conference on Neural Networks, 2022

Variable Few Shot Class Incremental and Open World Learning.

Touqeer Ahmad, Akshay Raj Dhamija, Mohsen Jafarzadeh, Steve Cruz, Ryan Rabinowitz, Chunchun Li, Terrance E. Boult

Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2022

Few-Shot Class Incremental Learning Leveraging Self-Supervised Features.

Touqeer Ahmad, Akshay Raj Dhamija, Steve Cruz, Ryan Rabinowitz, Chunchun Li, Mohsen Jafarzadeh, Terrance E. Boult

Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2022

2021

Automatic Open-World Reliability Assessment.

Mohsen Jafarzadeh, Touqeer Ahmad, Akshay Raj Dhamija, Chunchun Li, Steve Cruz, Terrance E. Boult

Proceedings of the IEEE Winter Conference on Applications of Computer Vision, 2021

Zillow Indoor Dataset: Annotated Floor Plans With 360deg Panoramas and 3D Room Layouts.

Steve Cruz, Will Hutchcroft, Yuguang Li, Naji Khosravan, Ivaylo Boyadzhiev, Sing Bing Kang

Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, 2021

Towards a Unifying Framework for Formal Theories of Novelty.

Terrance E. Boult, Przemyslaw A. Grabowicz, Derek S. Prijatelj, Roni Stern, Lawrence Holder, Joshua Alspector, Mohsen Jafarzadeh, Touqeer Ahmad, Akshay Raj Dhamija, Chunchun Li, Steve Cruz, Abhinav Shrivastava, Carl Vondrick, Walter J. Scheirer

Proceedings of the Thirty-Fifth AAAI Conference on Artificial Intelligence, 2021

2020

A Unifying Framework for Formal Theories of Novelty: Framework, Examples and Discussion.

Terrance E. Boult, Przemyslaw A. Grabowicz, Derek S. Prijatelj, Roni Stern, Larry B. Holder, Joshua Alspector, Mohsen Jafarzadeh, Touqeer Ahmad, Akshay Raj Dhamija, Chunchun Li, Steve Cruz, Abhinav Shrivastava, Carl Vondrick, Walter J. Scheirer

CoRR, 2020

Open-World Learning Without Labels.

Mohsen Jafarzadeh, Akshay Raj Dhamija, Steve Cruz, Chunchun Li, Touqeer Ahmad, Terrance E. Boult

CoRR, 2020

Infoprint: Information Theoretic Digital Image Forensics.

Aurobrata Ghosh, Zheng Zhong, Steve Cruz, Subbu Veeravasarapu, Maneesh Kumar Singh, Terrance E. Boult

Proceedings of the IEEE International Conference on Image Processing, 2020

Enhancing Open-Set Recognition using Clustering-based Extreme Value Machine (C-EVM).

James Henrydoss, Steve Cruz, Chunchun Li, Manuel Günther, Terrance E. Boult

Proceedings of the 2020 IEEE International Conference on Big Data (IEEE BigData 2020), 2020

2019

To Beta or Not To Beta: Information Bottleneck for DigitaL Image Forensics.

Aurobrata Ghosh, Zheng Zhong, Steve Cruz, Subbu Veeravasarapu, Terrance E. Boult, Maneesh Singh

CoRR, 2019

Learning and the Unknown: Surveying Steps toward Open World Recognition.

Terrance E. Boult, Steve Cruz, Akshay Raj Dhamija, Manuel Günther, James Henrydoss, Walter J. Scheirer

Proceedings of the Thirty-Third AAAI Conference on Artificial Intelligence, 2019

2017

Open Set Intrusion Recognition for Fine-Grained Attack Categorization.

Steve Cruz, Cora Coleman, Ethan M. Rudd, Terrance E. Boult

CoRR, 2017

Incremental Open Set Intrusion Recognition Using Extreme Value Machine.

James Henrydoss, Steve Cruz, Ethan M. Rudd, Manuel Günther, Terrance E. Boult

Proceedings of the 16th IEEE International Conference on Machine Learning and Applications, 2017

Toward Open-Set Face Recognition.

Manuel Günther, Steve Cruz, Ethan M. Rudd, Terrance E. Boult

Proceedings of the 2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops, 2017