T. C. Zhan

According to our database, T. C. Zhan authored at least 2 papers between 2022 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2023

Impact of Trapped Charge Vertical Loss and Lateral Migration on Lifetime Estimation of 3-D NAND Flash Memories.

Y. H. Liu, T. C. Zhan, Y. S. Yang, C. C. Hsu, A. C. Liu, W. Lin

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

An Abnormal Negative Temperature Dependence of Erasestate Vt Retention Shift in 3-D NAND Flash Memories.

Y. H. Liu, Y. S. Yang, T. C. Zhan, M. Hu, Z. J. Liu, W. Lin, A. C. Liu, Y. C. Hsu

Proceedings of the IEEE International Reliability Physics Symposium, 2022