Tapabrata Sen

According to our database, Tapabrata Sen authored at least 10 papers between 2017 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2023

A Magnetic Feedback-Based Δ-Σ Digitizing Interface for Giant Magnetoresistance Sensors.

Tapabrata Sen, Anoop Chandrika Sreekantan, Siddhartha Sen

IEEE Trans. Circuits Syst. II Express Briefs, 2023

PUF Probe: A PUF-based Hardware Authentication Equipment for IEDs.

Vishal D. Jadhav, Narahari N. Moudhgalya, Tapabrata Sen, T. V. Prabhakar

CoRR, 2023

2022

Novel Σ-Δ-Based Direct Digitizers for Single-Element Resistive Sensors With Considerations on Lead-Wire Compensation.

Tapabrata Sen, Anoop Chandrika Sreekantan, Siddhartha Sen

IEEE Trans. Instrum. Meas., 2022

2021

Linearized Sigma-Delta-Based Direct Digital Converter for GMR Sensors.

Tapabrata Sen, Anoop Chandrika Sreekantan, Siddhartha Sen

IEEE Trans. Instrum. Meas., 2021

A Versatile Direct-Digital Interface for Resistive Sensors Using Sigma-Delta Approach.

Tapabrata Sen, C. S. Anoop, Siddhartha Sen

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2021

2019

Study and Noise Analysis of a Linearizing Front-End Circuit for GMR Sensors.

Sagnik Dutta, Tapabrata Sen, Chandrika Sreekantan Anoop

Proceedings of the TENCON 2019, 2019

2018

On-Chip Implementation of Analog Linearization Schemes for Giant-Magnetoresistance Sensors.

Tapabrata Sen, Ashis Maity, Siddhartha Sen

Proceedings of the 12th International Conference on Sensing Technology, 2018

Efficacy Studies of a Novel Field Feedback Circuit for Giant Magnetoresistance Sensors.

Tapabrata Sen, C. S. Anoop, Siddhartha Sen

Proceedings of the 12th International Conference on Sensing Technology, 2018

2017

Design and performance evaluation of two novel linearisation circuits for giant magneto-resistance based sensors.

Tapabrata Sen, Anoop Chandrika Sreekantan, Siddhartha Sen

IET Circuits Devices Syst., 2017

Study and analysis of two GMR-based eddy-current probes for defect-detection.

Tapabrata Sen, Anoop Chandrika Sreekantan, Siddhartha Sen

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2017