Tianxu Zhao

Orcid: 0000-0001-8157-5663

According to our database1, Tianxu Zhao authored at least 11 papers between 2000 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2024
Design and Optimization of Electric Vehicle Traction Motor Considering Rotor Topology and Manufacturing Uncertainty.
IEEE Trans. Ind. Electron., May, 2024

2023
Analytical Calculation Method of Motor Natural Frequencies Based on Equivalent Model of Three-Layer Cylindrical Shell.
IEEE Trans. Ind. Electron., June, 2023

Third-Harmonic Current Injection Control of Five-Phase Permanent-Magnet Synchronous Motor Based on Third-Harmonic Current Reference Online Identification.
IEEE Access, 2023

Research on Suppression Method of Bearing Current for Electric Vehicle Motor Driven by SiC Inverter.
Proceedings of the 49th Annual Conference of the IEEE Industrial Electronics Society, 2023

2022
Current Sensor Fault-Tolerant Control for Five-Phase PMSM Drives Based on Third-Harmonic Space.
IEEE Trans. Ind. Electron., 2022

Sensorless Control of Five-Phase Permanent-Magnet Synchronous Motor Based on Third-Harmonic Space.
IEEE Trans. Ind. Electron., 2022

2021
Robust Nonfragile Guaranteed Cost Control for Uncertain Fuzzy Markov Jump Systems with Time-Varying Delays.
Int. J. Uncertain. Fuzziness Knowl. Based Syst., 2021

2020
Sensorless Control Strategy for IPMSM to Reduce Audible Noise by Variable Frequency Current Injection.
IEEE Trans. Ind. Electron., 2020

2003
Reliability Estimation Model of ICs Interconnect Based on Uniform Distribution of Defects on a Chip.
Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003

2001
Relation between Reliability and Yield of IC's Based on Discrete Defect Distribution Model.
Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001

2000
VLSI Yield Optimization Based on the Sub-Processing-Element Level Redundancy.
Proceedings of the 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 2000


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